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Article Dans Une Revue Le Vide Année : 1999

About SIMS analysis of organic materials


The specific parameters of secondary ion mass spectrometry (SIMS) for each regime (static or dynamic) are summarised. The particular aspects of organic material SIMS investigation are addressed, focusing on the analytical choices and problems. Examples of studies are proposed for both regimes, chosen either from the literature or amongst investigations conducted at CEMEF; they illustrate from a didactic viewpoint the interest of SIMS for the study of organic material surfaces.


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hal-00538398 , version 1 (22-11-2010)


  • HAL Id : hal-00538398 , version 1


Evelyne Darque-Ceretti, Robert Combarieu, Marc Aucouturier. About SIMS analysis of organic materials. Le Vide, 1999, 54 (292), p.141 +/. ⟨hal-00538398⟩
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