Article Dans Une Revue New Journal of Physics Année : 2010

Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

Résumé

Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.

Domaines

Fichier principal
Vignette du fichier
Vaxelaire-Proudhon New journal of physics 2010.pdf (2.91 Mo) Télécharger le fichier
Origine Fichiers éditeurs autorisés sur une archive ouverte
Licence
Loading...

Dates et versions

hal-00491060 , version 1 (20-02-2018)

Licence

Identifiants

Citer

Nicolas Vaxelaire, Henry Proudhon, S. Labat, C. Kirchlechner, J. Keckes, et al.. Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics, 2010, 12 (3), 12 p. ⟨10.1088/1367-2630/12/3/035018⟩. ⟨hal-00491060⟩
322 Consultations
335 Téléchargements

Altmetric

Partager

  • More